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Publications de l'équipe en 2006

Publié le 12 décembre 2018

Si nanowire growth and characterization using a microelectronics-compatible catalyst: PtSi
Baron T, Gordon M, Dhalluin F, Ternon C, Ferret P, Gentile P
Applied Physics Letters 89 (2006) 233111
http://dx.doi.org/10.1063/1.2402118

Nanometric thinning of bonded silicon wafers using sacrificial anodic oxidation and investigated by X-ray reflectivity
Buttard D, Krieg C, Fournel F
Surface Science 600 (2006) 4923-4930
http://dx.doi.org/10.1016/j.susc.2006.09.022

Preparation of a nanopatterned surface of bonded silicon wafers using electrochemical thinning and chemical etching: A scanning tunnel microscopy investigation
Buttard D, Krieg C, Pascale A, Gentile P, Fournel F
Surface Science 600 (2006) 4931-4936
http://dx.doi.org/10.1016/j.susc.2006.08.042

Size and shape effects on excitons and biexcitons in single InAs/InP quantum dots
Chauvin N, Salem B, Bremond G, Guillot G, Bru-Chevallier C, Gendry M
Journal of Applied Physics 100 (2006) 073702
http://dx.doi.org/10.1063/1.2353896

Single-mode room-temperature emission with a silicon rod lattice
Cluzel B, Calvo V, Charvolin T, Picard E, Noe P, Hadji E
Applied Physics Letters 89 (2006) 201111
http://dx.doi.org/10.1063/1.2364876

Nanobox array for silicon-on-insulator luminescence enhancement at room temperature
Cluzel B, Pauc N, Calvo V, Charvolin T, Hadji E
Applied Physics Letters 88 (2006) 133120
http://dx.doi.org/10.1063/1.2191089

Near-field spectroscopy of low-loss waveguide integrated microcavities
Cluzel B, Picard E, Charvolin T, Hadji E, Lalouat L, de Fornel F, Sauvan C, Lalanne P
Applied Physics Letters 88 (2006) 1112
http://dx.doi.org/10.1063/1.2170141

Growth mechanism of Si nanowhiskers and SiGe heterostructures in Si nanowhiskers: X-ray scattering and electron microscopy investigations
Dujardin R, Poydenot V, Devillers T, Favre-Nicolin V, Gentile P, Barski A
Applied Physics Letters 89 (2006) 153129
http://dx.doi.org/10.1063/1.2360225

Strain and composition of ultrasmall Ge quantum dots studied by x-ray scattering and in situ surface x-ray absorption spectroscopy
Dujardin R, Poydenot V, Schulli TU, Renaud G, Ulrich O, Barski A, Derivaz M, Colonna S, Metzger T
Journal of Applied Physics 99 (2006) 063510
http://dx.doi.org/10.1063/1.2181277

Electrical property improvements of yttrium oxide-based metal-insulator-metal capacitors
Durand C, Vallee C, Dubourdieu C, Kahn M, Derivaz M, Blonkowski S, Jalabert D, Hollinger P, Fang Q, Boyd IW
Journal of Vacuum Science and Technology A 24 (2006) 459-466
http://dx.doi.org/10.1116/1.2190649

Quantitative analysis of HOLZ line splitting in CBED patterns of epitaxially strained layers
Houdellier F, Roucau C, Clement L, Rouviere JL, Casanove MJ
Ultramicroscopy 106 (2006) 951-959
http://dx.doi.org/10.1016/j.ultramic.2006.04.011

High-Curie-temperature ferromagnetism in self-organized Ge1-xMnx nanocolumns
Jamet M, Barski A, Devillers T, Poydenot V, Dujardin R, Bayle-Guillemaud P, Rothman J, Bellet-Amalric E, Marty A, Cibert J, Mattana R, Tatarenko S
Nature Materials 5 (2006) 653-659
http://dx.doi.org/10.1038/nmat1686

Two-dimensional photonic crystals coupled to one-dimensional Bragg mirrors
Li X, Boucaud P, Checoury X, El Kurdi M, David S, Sauvage S, Yam N, Fossard F, Bouchier D, Fedeli JM, Calvo V, Hadji E
Ieee Journal of Selected Topics in Quantum Electronics 12 (2006) 1534-1538
http://dx.doi.org/10.1109/JSTQE.2006.885097

Quality factor control of Si-based two-dimensional photonic crystals with a Bragg mirror
Li X, Boucaud P, Checoury X, El Kurdi M, David S, Sauvage S, Yam N, Fossard F, Bouchier D, Fedeli JM, Salomon A, Calvo V, Hadji E
Applied Physics Letters 88 (2006) 091122
http://dx.doi.org/10.1063/1.2181633

Ultra-compact microdisk resonator filters on SOI substrate
Morand A, Zhang Y, Martin B, Huy KP, Amans D, Benech P, Verbert J, Hadji E, Fedeli JM
Optics Express 14 (2006) 12814-12821
http://dx.doi.org/10.1364/OE.14.012814

Ge quantum dots growth on nanopatterned Si(001) surface: Morphology and stress relaxation study
Pascale A, Gentile P, Eymery J, Meziere J, Bavard A, Schulli TU, Fournel F
Surface Science 600 (2006) 3187-3193
http://dx.doi.org/10.1016/j.susc.2006.06.004

Carrier recombination near threading dislocations in GaN epilayers by low voltage cathodoluminescence
Pauc N, Phillips MR, Aimez V, Drouin D
Applied Physics Letters 89 (2006) 161905
http://dx.doi.org/10.1063/1.2357881

Ordered growth of germanium dots induced by the strain field of tilt dislocations in molecular bonded silicon (001) thin films
Poydenot V, Dujardin R, Rouviere JL, Barski A, Meziere J, Fournel F
Surface Science 600 (2006) L135-L138
http://dx.doi.org/10.1016/j.susc.2006.03.020

Erbium-doped photonic crystal microcavity for light extraction enhancement at 300 K
Salomon A, Calvo V, Zelsmann M, Charvolin T, Fedeli JM, Hadji E
Ieee Journal of Selected Topics in Quantum Electronics 12 (2006) 1592-1595
http://dx.doi.org/10.1109/JSTQE.2006.885138

Ultracompact silicon-on-insulator ridge-waveguide mirrors with high reflectance
Velha P, Rodier JC, Lalanne P, Hugonin JP, Peyrade D, Picard E, Charvolin T, Hadji E
Applied Physics Letters 89 (2006) 171121
http://dx.doi.org/10.1063/1.2372581

Ultra-high-reflectivity photonic-bandgap mirrors in a ridge SOI waveguide
Velha P, Rodier JC, Lalanne P, Hugonin JP, Peyrade D, Picard E, Charvolin T, Hadji E
New Journal of Physics 8 (2006) 204
http://dx.doi.org/10.1088/1367-2630/8/9/204

Room temperature emission from Er-doped silicon-rich oxide microtorus
Verbert J, Mazen F, Charvolin T, Picard E, Calvo V, Noe P, Gerard JM, Hadji E, Orucevic F, Hare J, Lefevre-Seguin V
European Physical Journal-Applied Physics 34 (2006) 81-84
http://dx.doi.org/10.1051/epjap:2006048